X-ray photoelectron diffraction study of ultrathin PbTiO₃ films

摘要

Full hemispherical X-ray photoelectron diffraction (XPD) experiments have been performed to investigate at the atomic level ultrathin epitaxial c-axis oriented PbTiO (PTO) films grown on Nb-doped SrTiO substrates. Comparison between experiment and theory allows us to identify a preferential ferroelectric polarization state in a 60 Å -thick PTO film. Multiple scattering theory based on a cluster-model [ Phys. Rev. B , 075404 (2001)] is used to simulate the experiments.